Python utilities for loading, plotting, and editing wafer defect maps known as KLA Reference Files (KLARFs)
Drift-Sense solves the Navigation-Error Recovery problem. By utilizing a hybrid architecture of classical vision (NCC) and a lightweight Siamese CNN ranker, it accurately matches high-resolution reference patterns against noisy, low-resolution SEM images without heavy transformers.
Drift-Sense solves the Navigation-Error Recovery problem. By utilizing a hybrid architecture of classical vision (NCC) and a lightweight Siamese CNN ranker, it accurately matches high-resolution reference patterns against noisy, low-resolution SEM images without heavy transformers.
High-performance semiconductor navigation-error recovery via FFT phase correlation and periodicity-aware defect verification.
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