wafermap 0.32.0, testdata-parser 0.14.0 and tsmap 0.1.42: faster large lots, with breaking changes

[telecasterer]

wafermap 0.32.0 and @wafertools/testdata-parser 0.14.0 are out, and tsmap 0.1.42 ships with both. Large lots load far faster and use a fraction of the memory: data now moves from the parser to the map as one column per test instead of one object per die.

wafermap 0.32.0 and testdata-parser 0.14.0 contain breaking changes without a deprecation release. Each one changes behaviour rather than removing an export, so a deprecation notice would have had nothing to warn about in advance.

wafermap:

• Test values on built dies are read-only. On a map from buildWaferMap, die.testValues and die.testPass are snapshots. Reading them works as before, but assigning to them or changing a key throws. Pass the values to buildWaferMap instead, or copy the die.
• Wrong-type input values count as missing. This covers a bin, site number or test value that isn't a number, and a pass/fail verdict that isn't true/false. Each is still reported as a warning. A die whose only bin was text now has no verdict rather than failing, which can change yield.
• Pre-built dies get the same input checks as results.
• WaferMapResult.view is removed. It was marked internal.

testdata-parser:

• The parse functions return a columnar buffer (Uint8Array). decodeParsed from @wafertools/testdata-parser/columnar.js turns it back into the same ParsedStdf as before. decodeColumns gives columns that wafermap accepts directly.

Findings can change. Regional findings now report patterns confined to one region and small yield losses. Lot findings test each regional pattern on all wafers' data together and read, for example, "higher on 8/8 wafers, all wafers' data combined", so counts that used to read "seen on N/M wafers" may be higher.

The quickest way to try all of this is tsmap 0.1.42, which ships with both releases: open it in the browser at https://wafertools.github.io/tsmap/app/ (nothing to install), or download the desktop app from the release page below. A 341 MB, 266,000-die lot opens in the desktop app in about 15 seconds, and the browser build handles lots of about 60 million test values. Maps open ready to select (drag to select dies; hold Space to pan), selections fade the rest of the wafer, the legend shows several bins at once with Ctrl/Cmd+click, and the lot Summary panel shows the new findings.

If you pin a version (for example through esm.sh), stay on wafermap 0.31.x until you've checked the list above.

• tsmap in the browser: https://wafertools.github.io/tsmap/app/
• tsmap 0.1.42 release and installers: https://github.com/wafertools/tsmap/releases/tag/v0.1.42
• tsmap changelog: https://github.com/wafertools/tsmap/blob/main/CHANGELOG.md#0142--2026-09-27
• Upgrading: https://wafertools.github.io/wafermap/upgrading/
• wafermap changelog: https://github.com/wafertools/wafermap/blob/main/CHANGELOG.md#0320--2026-09-27
• What's New: https://wafertools.github.io/whats-new/#2026-09-26-large-lots-load-far-faster-and-use-far-less-memory and https://wafertools.github.io/whats-new/#2026-09-27-selections-you-can-see-several-bins-at-once-and-lot-findings-that-count-every-wafer