micro symbol fixed

Author: prathameshnium

README.md

@@ -78,8 +78,8 @@ PICA includes built-in support for the following instrument configurations, cove
 | Module | Configuration / Instrument | Use Case | Range |
 | :--- | :--- | :--- | :--- |
 | **Low-Resistance (Delta)** | **Keithley 6221** + **K2182** | Superconductors & metallic films; cancels thermal EMFs via AC Delta method. | 10 nOhm - 100 MOhm |
-| **Mid-Resistance (Standard)** | **Keithley 2400** SourceMeter | Semiconductors, oxides, general transport. | 100 uOhm - 200 MOhm |
-| **Mid-Resistance (High-Precision)** | **Keithley 2400** + **K2182** | Detecting subtle phase transitions. | 1 uOhm - 100 MOhm |
+| **Mid-Resistance (Standard)** | **Keithley 2400** SourceMeter | Semiconductors, oxides, general transport. | 100 µOhm - 200 MOhm |
+| **Mid-Resistance (High-Precision)** | **Keithley 2400** + **K2182** | Detecting subtle phase transitions. | 1 µOhm - 100 MOhm |
 | **High-Resistance** | **Keithley 6517B** Electrometer | Dielectrics, polymers, & ceramics. | 1 Ohm - 10 POhm |
 | **Dielectric** | **Keysight E4980A** | C-V Analysis. | 20 Hz - 2 MHz |
 | **Pyroelectric** | **K6517B** + **Temp Controller** | Current vs Temp (detecting Curie temperature). | pA - nA range |

docs/User_Manual.md

@@ -158,7 +158,7 @@ PICA is designed to be as versatile as possible, while being optimized for speci
 ### 5.2 General Transport (Standard I-V & R-T)
 
 **Target Hardware:** Keithley 2400 SourceMeter (or compatible SMU).
-**Typical Range:** 100 uOhm to 200 MOhm.
+**Typical Range:** 100 µOhm to 200 MOhm.
 
   * **Scientific Objective:** General transport characterization for semiconductors, oxides, and devices.
   * **Capabilities:**
@@ -184,7 +184,7 @@ PICA is designed to be as versatile as possible, while being optimized for speci
 ### 5.3 High Precision Transport
 
 **Target Hardware:** Keithley 2400 (Source) + K2182 (Nanovoltmeter).
-**Typical Range:** 1 uOhm to 100 MOhm.
+**Typical Range:** 1 µOhm to 100 MOhm.
 
   * **Scientific Objective:** Detects subtle phase transitions in semiconductors and oxides where standard SMU resolution is insufficient.
   * **Advantage:** Combines the stable sourcing of the SMU with the nanovolt-level sensitivity of a dedicated voltmeter, utilizing a true 4-wire configuration to eliminate lead resistance errors.